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Test Generation Guided Design for Testability
(1988-07-01)
This thesis presents a new approach to building a design for testability (DFT) system. The system takes a digital circuit description, finds out the problems in testing it, and suggests circuit modifications to correct ...
Generating Circuit Tests by Exploiting Designed Behavior
(1988-12-01)
This thesis describes two programs for generating tests for digital circuits that exploit several kinds of expert knowledge not used by previous approaches. First, many test generation problems can be solved efficiently ...