Browsing by Subject "artificial intelligence"
Now showing items 21-22 of 22
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Test Generation Guided Design for Testability
(1988-07-01)This thesis presents a new approach to building a design for testability (DFT) system. The system takes a digital circuit description, finds out the problems in testing it, and suggests circuit modifications to correct ...
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Vision Review
(MIT Artificial Intelligence Laboratory, 1978-05)